Sign in
Multistate Degradation and Condition Monitoring for Devices with Multiple Independent Failure Modes
Book chapter

Multistate Degradation and Condition Monitoring for Devices with Multiple Independent Failure Modes

Ramin Moghaddass and Ming J. Zuo
Applied Reliability Engineering and Risk Analysis, pp.17-31
Wiley Series in Quality and Reliability Engineering, Wiley
2014-01-01

Abstract

Engineering Engineering, Industrial Operations Research & Management Science Science & Technology Technology

Metrics

UN Sustainable Development Goals (SDGs)

This output has contributed to the advancement of the following goals:

undefined

Source: InCites

Details