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An intrinsic assessment and comparison of biometric systems through wavelet analysis
Conference proceeding

An intrinsic assessment and comparison of biometric systems through wavelet analysis

J.P Burnes, J.M Tien, Woojin Chang and IEEE
SMC'03 Conference Proceedings. 2003 IEEE International Conference on Systems, Man and Cybernetics. Conference Theme - System Security and Assurance (Cat. No.03CH37483), Vol.5, pp.4514-4521 vol.5
2003

Abstract

Airports Biometrics Image analysis Information security NIST Robustness Signal analysis Standards development Terrorism Wavelet analysis

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