Fundamental Noise Processes in TES Devices

Conference proceeding

Peer reviewed

IEEE transactions on applied superconductivity, Vol.21(3), pp.267-271

The 2010 Applied Superconductivity Conference, Washington, DC, August 1-6, 2010

2011

Abstract

Infrared, submillimeter wave, microwave and radiowave instruments, equipment and techniques

Electrical engineering. Electrical power engineering

Exact sciences and technology

Electronics

Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing

Design. Technologies. Operation analysis. Testing

Physics

Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices

Integrated circuits

Bolometer; infrared, submillimeter wave, microwave and radiowave receivers and detectors

General equipment and techniques

Instruments, apparatus, components and techniques common to several branches of physics and astronomy

General

Applied sciences

Electromagnets

Various equipment and components

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Citation topics: 5 Physics; 5.30 Superconductor Science; 5.30.929 Josephson Junctions
Web Of Science research areas: Engineering, Electrical & Electronic; Physics, Applied
ESI research areas: Physics

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Title: Fundamental Noise Processes in TES Devices
Creators: Massimiliano GALEAZZI - University of Miami, Coral Gables, FL 33146, United States
Publication Details: IEEE transactions on applied superconductivity, Vol.21(3), pp.267-271
Conference: The 2010 Applied Superconductivity Conference, Washington, DC, August 1-6, 2010
Publisher: Institute of Electrical and Electronics Engineers; New York, NY
Academic Unit: College of A&S; A&S - Physics
Language: English
Resource Type: Conference proceeding
Record Identifier: 991031559282102976