Sign in
Multi-state degradation analysis for a condition monitored device with unobservable states
Conference proceeding

Multi-state degradation analysis for a condition monitored device with unobservable states

R Moghaddass and M. J Zuo
2012 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering, pp.549-554
2012-06

Abstract

Condition monitoring Degradation Estimation Mathematical model multi-state degradation Numerical models Reliability semi-Markov process Stochastic processes unsupervised estimation

Metrics

6 Record Views

Details