A parameter estimation method for a condition-monitored device under multi-state deterioration

Journal article

Peer reviewed

Reliability engineering & system safety, Vol.106, pp.94-103

2012

Abstract

Applied sciences

Computer science; control theory; systems

Control theory. Systems

Exact sciences and technology

General

Industrial metrology. Testing

Mechanical engineering. Machine design

Modelling and identification

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Citation topics: 4 Electrical Engineering, Electronics & Computer Science; 4.237 Safety & Maintenance; 4.237.651 Preventive Maintenance
Web Of Science research areas: Engineering, Industrial; Operations Research & Management Science
ESI research areas: Engineering

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Source: InCites

Title: A parameter estimation method for a condition-monitored device under multi-state deterioration
Creators: Ramin Moghaddass - Reliability Research Lab, Department of Mechanical Engineering, University of Alberta, Edmonton, Canada
Ming J Zuo - Reliability Research Lab, Department of Mechanical Engineering, University of Alberta, Edmonton, Canada
Publication Details: Reliability engineering & system safety, Vol.106, pp.94-103
Publisher: Elsevier
Academic Unit: College of Engineering; CoE - Industrial Engineering
Language: English
Resource Type: Journal article
Record Identifier: 991031614669802976