Alternative Measurement Paradigms for Measuring Executive Functions: SEM (Formative and Reflective Models) and IRT (Rasch Models)

Journal article

Peer reviewed

George Engelhard and Jue Wang

Measurement (Mahwah, N.J.), Vol.12(3), pp.102-108

2014-07-03

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Title: Alternative Measurement Paradigms for Measuring Executive Functions: SEM (Formative and Reflective Models) and IRT (Rasch Models)
Creators: George Engelhard - University of Georgia
Jue Wang - University of Georgia
Publication Details: Measurement (Mahwah, N.J.), Vol.12(3), pp.102-108
Publisher: Routledge
Academic Unit: School of Education - Education & Psychological Studies; School of Education & Human Development
Language: English
Resource Type: Journal article
Record Identifier: 991031713650402976