Atom-Probe Tomography: Detection Efficiency and Resolution of Nanometer-Scale Precipitates in a Ti-5553 Alloy

Journal article

Peer reviewed

D Isheim, J Coakley, A Radecka, D Dye, T.J Prosa, Y Chen, P.A.J Bagot and D.N Seidman

Microscopy and microanalysis, Vol.22(S3), pp.702-703

2016-07

Abstract

Analytical and Instrumentation Science Symposia

Research and Applications in Atom Probe Tomography

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Title: Atom-Probe Tomography: Detection Efficiency and Resolution of Nanometer-Scale Precipitates in a Ti-5553 Alloy
Creators: D Isheim - Department of Materials Science and Engineering, Northwestern University, Evanston, IL, USA
J Coakley - Department of Materials Science and Engineering, Northwestern University, Evanston, IL, USA
A Radecka - Department of Materials, Imperial College, South Kensington, London, England
D Dye - Department of Materials, Imperial College, South Kensington, London, England
T.J Prosa - CAMECA Instruments, Inc., Madison, WI, USA
Y Chen - CAMECA Instruments, Inc., Madison, WI, USA
P.A.J Bagot - Department of Materials, University of Oxford, Oxford, England
D.N Seidman - Department of Materials Science and Engineering, Northwestern University, Evanston, IL, USA
Publication Details: Microscopy and microanalysis, Vol.22(S3), pp.702-703
Publisher: Cambridge University Press
Number of pages: 2
Academic Unit: College of Engineering; CoE - Mechanical & Aerospace Engineering
Language: English
Resource Type: Journal article
Record Identifier: 991031599300302976