Empirical Bayesian LASSO-logistic regression for multiple binary trait locus mapping

Journal article

Open access

Peer reviewed

Anhui Huang, Shizhong Xu and Xiaodong Cai

BMC genetics, Vol.14(1), pp.5-5

2013-02-15

PMCID: PMC3771412

PMID: 23410082

Abstract

Epistatic effects

Logistic regression

Methodology

Bayesian shrinkage

Binary traits

QTL mapping

url

https://doi.org/10.1186/1471-2156-14-5View

Published (Version of record) Open

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Collaboration types: Domestic collaboration
Citation topics: 3 Agriculture, Environment & Ecology; 3.4 Crop Science; 3.4.96 QTL
Web Of Science research areas: Genetics & Heredity
ESI research areas: Molecular Biology & Genetics

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Title: Empirical Bayesian LASSO-logistic regression for multiple binary trait locus mapping
Creators: Anhui Huang - Department of Electrical and Computer Engineering, University of Miami, Coral Gables, FL 33146, USA
Shizhong Xu - Department of Botany and Plant Sciences, University of California, Riverside, CA 92521, USA
Xiaodong Cai - Department of Electrical and Computer Engineering, University of Miami, Coral Gables, FL 33146, USA
Publication Details: BMC genetics, Vol.14(1), pp.5-5
Publisher: BioMed Central
Academic Unit: College of Engineering; CoE - Electrical & Computer Engineering
Language: English
Resource Type: Journal article
PMID: 23410082
PMCID: PMC3771412
Record Identifier: 991031560168902976