Environmental Scanning Electron Microscopy on Ultra-thin Films in 2-D and 3-D

Journal article

Peer reviewed

Microscopy and microanalysis, Vol.10(S02), pp.1052-1053

2004-08

Abstract

In-situ Characterization of Dynamic Processes by Variable Pressure Electron Microscopy

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

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Title: Environmental Scanning Electron Microscopy on Ultra-thin Films in 2-D and 3-D
Creators: R Leblanc - University of Miami, Florida
Publication Details: Microscopy and microanalysis, Vol.10(S02), pp.1052-1053
Publisher: Cambridge University Press; New York, USA
Number of pages: 2
Academic Unit: Leadership Department; College of A&S; A&S - Chemistry
Language: English
Resource Type: Journal article
Record Identifier: 991031578522402976