Focused ion beams in future nanoscale probe recording

Journal article

Peer reviewed

Dmitri Litvinov and Sakhrat Khizroev

Nanotechnology, Vol.13(2), pp.179-184

2002

Abstract

Applied sciences

Electronics

Exact sciences and technology

Magnetoelectric, magnetostrictive, magnetoacoustic, magnetooptic and magnetothermal devices. Spintronics

Miscellaneous

Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices

Storage and reproduction of information

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Collaboration types: Domestic collaboration
Citation topics: 5 Physics; 5.88 Electromagnetism; 5.88.109 Exchange Bias
Web Of Science research areas: Materials Science, Multidisciplinary; Nanoscience & Nanotechnology; Physics, Applied
ESI research areas: Materials Science

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Title: Focused ion beams in future nanoscale probe recording
Creators: Dmitri Litvinov - University of Michigan–Ann Arbor
Sakhrat Khizroev - Carnegie Mellon University
Publication Details: Nanotechnology, Vol.13(2), pp.179-184
Publisher: Institute of Physics
Academic Unit: CoE - Electrical & Computer Engineering; College of Engineering
Language: English
Resource Type: Journal article
Record Identifier: 991031725366602976