Abstract
In this work, the physics of magnetization reversal in patterned high anisotropy (Co/Pd)(n) magnetic multilayer arrays is investigated where the magnetic island size, pitch, recording layer thickness, and the underlying multilayer magnetic properties are varied. Magnetization reversal was studied using magneto-optical Kerr effect magnetometry and magnetic force microscopy and supported by micromagnetic modeling. It is found that magnetic island dimension and/or pitch cannot alone explain the variations in the switching behavior of the patterned arrays and the observed values of switching field distribution (SFD). It is found that the ratio of switched magnetic islands to the total number of islands for a giving reversing field depends strongly on the magnetic island geometry. Stray fields from neighboring magnetic islands result in relatively minor influence on the switching characteristics. Micromagnetic modeling was used to further understand the magnetization reversal in patterned arrays. It is found that the bit-edge imperfections such as tapering contribute significantly to the SFD. (C) 2008 American Institute of Physics.
