Scanning tunneling and atomic force microscopy studies of Langmuir-Blodgett films

Journal article

Peer reviewed

J. A DEROSE and R. M LEBLANC

Surface science reports, Vol.22(3), pp.73-126

1995

Abstract

Electron, ion, and scanning probe microscopy

Scanning probe microscopy: scanning tunneling, atomic force, scanning optical, magnetic force, etc

Exact sciences and technology

Condensed matter: structure, mechanical and thermal properties

Langmuir-blodgett films

Structure of solids and liquids; crystallography

Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties)

Physics

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Citation topics: 2 Chemistry; 2.190 Surfactants, Lipid Bilayers & Antimicrobial Peptides; 2.190.254 Lipid Bilayers
Web Of Science research areas: Chemistry, Physical; Physics, Condensed Matter
ESI research areas: Physics

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Title: Scanning tunneling and atomic force microscopy studies of Langmuir-Blodgett films
Creators: J. A DEROSE - Univ. Miami, dep. chemistry, Coral Gables FL 33124-0431, United States
R. M LEBLANC - Univ. Miami, dep. chemistry, Coral Gables FL 33124-0431, United States
Publication Details: Surface science reports, Vol.22(3), pp.73-126
Publisher: Elsevier Science; Amsterdam
Academic Unit: Leadership Department; College of A&S; A&S - Chemistry
Language: English
Resource Type: Journal article
Record Identifier: 991031575451602976