Using Maximum Entry-Wise Deviation to Test the Goodness of Fit for Stochastic Block Models

Journal article

Jianwei Hu, Jingfei Zhang, Hong Qin, Ting Yan and Ji Zhu

Journal of the American Statistical Association, Vol.ahead-of-print(ahead-of-print), pp.1-10

2020-09-08

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Collaboration types: Domestic collaboration; International collaboration
Citation topics: 4 Electrical Engineering, Electronics & Computer Science; 4.48 Knowledge Engineering & Representation; 4.48.120 Complex Networks
Web Of Science research areas: Statistics & Probability
ESI research areas: Mathematics

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Title: Using Maximum Entry-Wise Deviation to Test the Goodness of Fit for Stochastic Block Models
Creators: Jianwei Hu - Department of Statistics, Central China Normal University, Wuhan, China
Jingfei Zhang - Department of Management Science, University of Miami, Coral Gables, FL
Hong Qin - Department of Statistics, Central China Normal University, Wuhan, China; , Department of Statistics, Zhongnan University of Economics and Law, Wuhan, China
Ting Yan - Department of Statistics, Central China Normal University, Wuhan, China
Ji Zhu - Department of Statistics, University of Michigan, Ann Arbor, MI
Publication Details: Journal of the American Statistical Association, Vol.ahead-of-print(ahead-of-print), pp.1-10
Academic Unit: MHBS - Management Science; Miami Herbert Business School
Language: English
Resource Type: Journal article
Record Identifier: 991031577154702976